Micron MTFDDAK256MAM-1K1 Datasheet download pdf (Page 9)

Electrical Characteristics

Stresses greater than those listed may cause permanent damage to the device. This is a

stress rating only, and functional operation of the device at these or any other condi-

tions above those indicated in the operational sections of this specification is not im-

plied. Exposure to absolute maximum rating conditions for extended periods may affect

reliability.

Table 9: SATA Power Consumption

Density Idle Average Active Average

Sequential Write/Read Maximum

(128k transfer) Unit

128GB <85 150 3500 2000 mW

256GB <85 160 4000 2200 mW

512GB <100 280 5500 2500 mW

Notes:

1. Data taken at 25°C using a 6 Gb/s SATA interface.

2. Active average power measured while running MobileMark

2007 Productivity Suite.

3. DIPM (device-initiated power management) enabled.

4. Sequential power measured in IOMETER MAX with 128KB transfer size.

Table 10: Maximum Ratings

Parameter/Condition Symbol Min Max Unit

Voltage input V5 4.5 5.5 V

Operating temperature T

0 70 °C

Non-operating temperature –40 85 °C

Rate of temperature change – 20 °C/hour

Relative humidity (non-condensing) 5 95 %

Note:

1. Temperature is best measured with a thermocouple attached to the center point of the

exterior of the case on the cast side (side where the SATA connector is visible). Contact

with the drive label is acceptable.

Table 11: Shock and Vibration

Parameter/Condition Specification

Operating shock 1500 G/1.0ms

Operating vibration 2–500Hz at 3.1G

C400 2.5-Inch NAND Flash SSD

Electrical Characteristics

PDF: 09005aef8455a0a5

realssd_c400_2_5.pdf - Rev. D 09/11 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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Micron MTFDDAK256MAM-1K1 Datasheet Page 9